Probe Pins

Spring-loaded connectors used in electronic testing to make temporary and reliable contact with circuit boards and components.

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Probe Heads

Specialized testing devices used to electrically test wafer-level chip scale packages by making contact with their small surface pads before the wafers are diced into individual chips.

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Test Contactors

Devices that create temporary electrical connections between the device under test (DUT) and test equipment to assess the device's performance and functionality.

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Hand Socket Lids

Manually operated covers used to secure a semiconductor device within a test socket, ensuring stable and reliable contact between the device and the test interface during the testing process.

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